HTS-110 2T Projected Field Magnet

Compact
Cryogen-free
Fast ramping
Excellent sample access
Low vibration
Sample isolated from magnet vibration

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Applications

  • Magnetic probing systems
  • Scanning Probe Microscope (SPM)
  • Scanning Tunnelling microscope (STM)
  • Atomic Force Microscope (AFM)
  • Magnetic Force Microscope (MFM)
  • Magneto-optic measurement
  • Hall effect measurement
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